785 nm

SKYLARK 785 NX

785 nm single frequency diode-pumped solid-state laser delivering spectrally pure NIR light from an efficient form factor.

APPLICATIONS

High power, high performance laser for advanced NIR metrology and microscopy applications

Metrology and microscopy

Our lasers deliver up to 400 mW of near-infrared light for applications such as:

  • Raman spectroscopy
  • Raman mapping
  • NIR microscopy
  • Materials inspection

Skylark 785 NX CW DPSS laser

The Skylark 785 NX CW DPSS laser provides ultra-stable single frequency NIR light at 785 nm for demanding and emerging applications.

Engineered for consistent long-term, stable performance, delivering up to 400 mW of ultra-stable output, low noise, and spectral purity.

Key specifications

Wavelength

785 nm


Output power

up to 400 mW


Spectral bandwidth

≤ 300 kHz, < 13 kHz / 1 ms


Beam quality

M² ≤ 1.2


Spatial mode

TEM₀₀


Operational mode

CW, SLM


Beam parameters

Beam height

54.2 mm


Beam diameter

0.8 - 1.2 mm


Beam divergence

≤ 1.0 mrad, diffraction limited


Beam pointing stability

≤ 5 μrad/°C


Coherence length

> 100 m


Polarisation ratio

≥ 100:1, vertical


Laser performance

Spectral stability (8 hours)

± 0.2 pm


Output power stability (8 hours)

≤ 2.0 % Peak to Peak


Output power noise (10 Hz - 10 MHz)


ASE noise

< – 80 dB


Warm up time

5 - 30 mins


Operating conditions

Ambient temperature

18 - 30 °C


Laser interface stability

± 1.5 °C


Storage

0 - 50 °C


5 - 95 %, non-condensing


Power consumption (typical)

< 50 W


Laser dimensions

Laser head (L x W x H)

257 x 150 x 87 mm


Controller (L x W x H)

150 x 176 x 61 mm


REQUEST A QUOTE

Reveal weak and complex Raman samples with high resolution at 785 nm. Get in touch to tailor a laser to your application.