Lasers for Raman and UV Raman spectroscopy

Ultra-stable, narrow linewidth DPSS lasers engineered to reveal weak and complex Raman spectra with high resolution and long term stability

High optical power and outstanding spectral purity are critical for enhancing signal strength in Raman and UV Raman spectroscopy applications, especially in samples with weak or complex scattering characteristics.

Single frequency diode-pumped solid-state (DPSS) lasers from Skylark Lasers provide ultra-stable, low noise sources in the UV and NIR with ASE noise < – 80 dB, and passive linewidth < 13 kHz / 1 ms.

Available at 320 nm (up to 200 mW), 349 nm (up to 400 mW), and NIR wavelengths (780 nm / 785 nm up to 400 mW), Skylark NX lasers deliver the highest usable power in their class for Raman spectroscopy — without the noise, instability, or alignment issues of traditional gas or amplified-diode systems.

View 785 nm laser specifications

View 320 nm laser specifications

Narrow linewidth

≤ 13 kHz / 1 ms

Reduces spectral broadening, leading to sharper Raman peaks, better signal resolution, and SNR (signal-to-noise ratio).

Low noise

≤ 0.3% RMS

Delivers a stable baseline and consistent signal intensity, preventing laser noise from masking weak Raman features.

Clean beam

M² ≤ 1.2

Provides a pure TEM₀₀ mode with > 95% beam circularity for efficient, low noise propagation through optical paths.

Consistent wavelength

± 0.2 pm

Maintains ± 0.2 pm wavelength stability over 8 hours, ensuring consistent calibration and spectral integrity.

Achieve sharper spectra and shorter acquisition times with Skylark NX single frequency DPSS lasers.

Skylark NX single frequency DPSS lasers provide the wavelength stability, spectral purity, and low noise demanded by advanced Raman and UV Raman spectroscopy techniques. Available at 320 nm, 349 nm, 780 nm, and 785 nm, narrow linewidth combines with high power and long term stability to deliver reliable Raman excitation and quantitative spectral analysis.

Whether used as a 785 nm Raman laser for confocal or SERS systems, or as a UV Raman excitation source at 320 nm or 349 nm, Skylark NX lasers combine solid-state reliability with the precision required for integration into cutting-edge analytical and OEM instrumentation

UV resonance Raman spectroscopy

Skylark NX UV DPSS lasers at 320 nm and 349 nm with linewidths below 500 kHz. Enhancing Raman scattering efficiency and minimising fluorescence backgrounds, Skylark NX UV lasers enable clear, high-contrast spectra in resonance Raman applications.

High power provides shorter acquisition times and higher throughput, while spectral purity and long term wavelength stability maintain consistent excitation conditions across extended measurements.

Compared with gas or frequency-doubled diode systems, Skylark NX UV lasers combine higher usable power, output stability, and solid-state reliability for reproducible UV Raman analysis.

Micro-Raman and confocal Raman microscopy

Skylark NX DPSS lasers at 349 nm and 785 nm combine a narrow linewidth and low noise to ensure stable, uniform illumination for high resolution Raman imaging and spectral mapping.

Maintaining wavelength accuracy, Skylark NX lasers enable consistent focus, reducing the need for recalibration and realignment.

Where multimode diode lasers introduce beam distortion and wavelength drift, Skylark NX sources deliver stable, low noise excitation with reliable long term performance in Raman microscopy and analytical systems.

UV Raman and photoluminescence (PL)

Skylark NX UV DPSS lasers at 320 nm and 349 nm deliver single frequency, continuous wave excitation with sub-MHz linewidth and up to 400 mW output power. Skylark NX UV lasers deliver stable ultraviolet illumination for Raman and photoluminescence systems that require high spectral purity and low noise. The narrow linewidth and long term wavelength stability ensure consistent excitation energy, supporting quantitative analysis and reliable signal comparison across measurement sessions. With solid-state reliability and high beam quality, Skylark NX UV lasers offer a clean, low maintenance alternative to gas-based sources for precise, repeatable UV Raman and PL measurements in research and OEM instrumentation.

FAQS

DPSS lasers vs diode lasers for Raman spectroscopy

What Raman applications are better suited to diode lasers?

Diode lasers can be an effective choice for routine Raman measurements where moderate wavelength drift, broader linewidth, or higher noise levels are acceptable. They’re often used in entry-level benchtop instruments, educational setups, and portable analyzers that prioritize compactness and cost over spectral precision. For applications demanding long-term wavelength stability, sub-MHz linewidth, or low relative intensity noise—such as UV Raman, SERS, micro-Raman, or process monitoring—a single-frequency DPSS laser provides significantly better spectral performance and reproducibility. Equally critical is spectral and power stability: even small fluctuations can cause baseline drift or Raman-shift misalignment over long measurements. Skylark NX lasers combine high optical power with low noise (≤ 0.3 % RMS) and exceptional wavelength stability, ensuring consistent excitation and reproducible spectra in both research and production systems.

Are Skylark NX lasers suitable for integration into OEM Raman systems?

Yes. Skylark NX lasers are specifically designed for OEM and system integration. They feature a compact, thermally stable platform with straightforward electrical and mechanical interfaces. Long-term wavelength stability (±0.2 pm), low intensity drift (< 2 %), and factory pre-alignment reduce calibration requirements during instrument assembly. With up to 400 mW of single-frequency output at 320 nm, 349 nm, 780 nm, or 785 nm, NX lasers provide a robust, maintenance-free light source that simplifies system design and improves overall measurement repeatability.

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